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The paper presents an experimental demonstration of fine-resolution stochastic analog-to-digital converter. The effective LSB resolution and number of comparators versus linear region neighbouring the trip point are introduced by measurement data. The approach is to use a fully differential comparator scheme to suppress input common-mode noise. A layout strategy of manually placing and routing is...
Traditional binary transition-edge search methods are sensitive to hysteresis, noise and jitter, and also require a relatively large number of samples in order to accurately detect a noisy transition edge. A new transition-edge search circuit is introduced in this paper which utilizes a stochastic comparator group. By incorporating stochastic properties, our proposed circuit design accelerates the...
This paper presents a subsampling two-step coarse-fine stochastic A/D converter for on-chip measurement of high speed signals. Using equivalent time sampling techniques, we achieve an effective sampling rate of over 230 GS/s measurements for a 23.0023 MHz sine wave, and over 5.8 TS/s for an on-chip 2921.0115 MHz 7-bit PRBS while using a clock rate of 23 MHz. Our ADC achieves an SNR of 55.3 dB and...
We introduce a stochastic time-to-digital converter (TDC) that has 180–770fs tunable resolution, less than 0.6LSB INL, and selectable dynamic range offset. Previous arbiter-based TDCs have fine resolution but small dynamic range which is difficult to calibrate. Our approach uses comparators as decision elements to precisely control dynamic range offset.
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