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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 340 - 348
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 146 - 156
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 667 - 684
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 576 - 582
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 304 - 317
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 213 - 219
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 604 - 609
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 376 - 383
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 443 - 457
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 319 - 325
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 149 - 155
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 512 - 522
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 203 - 212
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 103 - 109
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 93 - 97
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 3 > 547 - 553
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 413 - 419
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 63 - 67
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 19 - 34
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 66 - 75