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IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1425 - 1432
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1372 - 1378
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1572 - 1578
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1592 - 1597
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1397 - 1404
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1598 - 1604
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1566 - 1571
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1391 - 1396
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1441 - 1445
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1139 - 1145
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1379 - 1384
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 5 > 1149 - 1155
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1369 - 1372
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1779 - 1784
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1490 - 1495
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1460 - 1465
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1496 - 1502
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1378 - 1382
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1741 - 1747
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1390 - 1397