Search results for: A. Ibrahim
Microelectronics Reliability > 2016 > 58 > C > 204-210
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 4 > 1038 - 1043
Microelectronics Reliability > 2016 > 58 > C > 204-210
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 4 > 1038 - 1043