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The authors comments on the work of Hoffman and Skvor "A Novel Vector Network Analyzer”(1998). It was demonstrated in this paper that only five independent parameters are needed to fully map the complex reflection coefficient of an unknown sample to amplitude-only reflection measurement instead of six parameters as concluded in the above paper.
A microcontroller based microwave free-space measurement system for a real-time determination of dielectric permittivity of high loss planar materials is proposed. The measurement system is comprised of two main sections - microwave and electronic sections. While microwave section of the system provides for measuring only amplitudes of transmission and reflection coefficients using free-space method...
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