Wyniki wyszukiwania dla: Mehran Mozaffari Kermani
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 85 - 91
Journal of Electronic Testing > 2009 > 25 > 4-5 > 225-245
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 85 - 91
Journal of Electronic Testing > 2009 > 25 > 4-5 > 225-245