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This paper describes the total ionizing dose test facility available at the University of Saskatchewan. Two Co-60 sources are available one for high and the other low dose rate radiation effects testing of electronics. The total ionizing dose performance of an operation amplifier was evaluated. The testing results compare well with previously published results.
This paper presents and evaluates a new built-in current sensor used to detect n-well single-event transients (SETs) induced by radiation strikes in integrated circuits (IC). A 28 nm bulk CMOS test chip containing the proposed sensor design was irradiated by two-photon absorption lasers. Both simulation and experimental data confirm the validity of the proposed design and demonstrate that it can be...
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