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Electromagnetic compatibility (EMC) is an essential requirement to electronic systems in which integrated circuits have a major influence. Intrinsic degradation mechanisms, which produces anticipated wear-out in deep submicron components threat not only the reliability of circuits, but also EMC performances. The need to predict and ensure long-term EMC has become a key challenge. This paper aims at...
In order to merge low power and high voltage devices on the same chip at competitive cost, Smart Power integrated circuits (ICs) are extensively used. The presence of low power and high voltage devices in Smart Power ICs cause parasitic substrate interaction between switched power stages and sensitive analog blocks. Nowadays this is the major cause of failure of Smart Power ICs inducing costly circuit...
Analog circuits such as linear voltage regulators are very sensitive to electromagnetic interferences which induce voltage offset on their outputs. In harsh environments, the aging of this component can be accelerated and could lead to an increase of the effect of electromagnetic interferences. This paper proposes an original study about the drift of the susceptibility level of a low dropout voltage...
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