Search results for: A. Boyer
Journal of Electronic Testing > 2012 > 28 > 6 > 791-802
IEEE Transactions on Electromagnetic Compatibility > 2009 > 51 > 4 > 892 - 900
IEEE Transactions on Electromagnetic Compatibility > 2009 > 51 > 1 > 78 - 100
Journal of Electronic Testing > 2012 > 28 > 6 > 791-802
IEEE Transactions on Electromagnetic Compatibility > 2009 > 51 > 4 > 892 - 900
IEEE Transactions on Electromagnetic Compatibility > 2009 > 51 > 1 > 78 - 100