Search results for: A. Boyer
Journal of Electronic Testing > 2012 > 28 > 3 > 339-348
Journal of Electronic Testing > 2012 > 28 > 6 > 791-802
Journal of Electronic Testing > 2012 > 28 > 3 > 339-348
Journal of Electronic Testing > 2012 > 28 > 6 > 791-802