Search results for: Mohamed H. Zaki
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 10 > 1811 - 1822
Journal of Electronic Testing > 2010 > 26 > 1 > 97-109
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 10 > 1811 - 1822
Journal of Electronic Testing > 2010 > 26 > 1 > 97-109