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DC-DC converter, which is widely used in system and equipment, is a kind of complex component. The technology maturity of the device seriously influences the reliability of the system and equipment. AHP combined with KPA was proposed to evaluate the technology maturity for DC-DC converter. The failure modes and failure mechanisms of the device were studied. The CTEs belonging to the different dimensions...
A new simulation design against Single Event Effects (SEEs) is proposed in this paper, for the analysis and the implementation of circuits on Static Random Access Memory (SRAM) based Field-Programmable Gate Arrays (FPGAs). Firstly, SEEs mechanism and process was summarized. Then Monte Carlo method was used to calculate the neutron energy spectrum distribution at different height of the near space...
Obsolescence makes equipments supporting and maintaining hard and costly. It hurts the equipments reliability seriously. In the past decades, electronic technology has developed very rapidly causing components (and particularly the FPGAs) to have a shortened life span. So the problem of electronic component obsolescence in complex electronic or long life systems such as aircraft submarines and ships...
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