Search results for: Michael Pecht
Microelectronics Reliability > 2016 > 65 > C > 1-7
Microelectronics Reliability > 2016 > 62 > C > 113-123
Journal of Electronic Materials > 2009 > 38 > 6 > 815-827
Journal of Electronic Materials > 2008 > 37 > 8 > 1130-1138