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Hot carrier injection (HCI) and negative bias temperature instability (NBTI) become dominant reliability issues in nanometer CMOS technology. These aging effects can induce additional delay which will be accumulated through logic gates and thus degrade the performance of the circuits. This paper discusses performance degradations induced by aging mechanisms in digital integrated circuits. We propose...
Reliability becomes a critical challenge in analogue integrated circuits (ICs) design in deep sub-micron region. In order to manufacture ICs with high quality, methodology and analysis must include reliability consideration in design loop. In this paper, we propose a new statistical reliability-aware approach to evaluate circuit performance under ageing effects and process variations. BSIM4 transistor...
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