The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Single-stress accelerated reliability growth test is restricted as the limited improvement of a stress. In order to further shorten the lead time of a product, on the basis of the single-stress accelerated reliability growth test, we developed a double-stress accelerated reliability growth model based on AMSAA-BISE growth model and generalized Egring accelerated model. We presented the test program...
The boundary element method (BEM) has been successfully applied to 2D and 3D large scale potential problems and efficiently reduce the computing operations and memory requirements. In this paper, by using Laplace Transformation, a new kind of fast BEM for 2D potential problems is presented. Using this method, the logarithm operation can be converted to product operation, the calculation complexity...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.