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Enhancing power cycling capability of power semiconductor devices is highly demanded in order to increase the long-term reliability of multilevel inverters. Ageing of power switches and their cooling systems leads to their accelerated damage due to excess power losses and junction temperatures. Therefore, thermal stresses relief (TSR) is the most effective solution for lifetime extension of power...
Multilevel Inverters play key role in grid integration of photovoltaic (PV) systems. Although power semiconductor devices in multilevel inverters represent the most expensive and vulnerable parts according to the recent reliability surveys. Thermal stresses in power semiconductor devices represent the main cause of their failures. Therefore, improved controllers with lower thermal stresses are highly...
This paper presents a comprehensive online condition monitoring algorithm for power semiconductor devices. The proposed algorithm utilizes the voltage measurement between the collector and emitter of power semiconductor devices to fully monitor the performance and state of the device. The proposed algorithm provides four different detection and monitoring conditions of the device; these four elements...
This paper presents a unified space vector modulation (SVM) algorithm for lifetime prolongation of thermally-overheated power semiconductor devices in multilevel inverters. Thermal overheating is the main cause of shortened-lifetime and open-circuit faults of the devices. Power semiconductor devices are subjected to thermal overheating due to their ageing that results from continuous overloading and...
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