The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We have studied the effect of substrate temperature in molybdenum (Mo) back contact deposition on its structural evolution, optical properties, and most importantly, the over-deposited CuIn1−xGaxSe2 solar cell performance. A series of Mo thin films was DC sputtered onto thermally oxidized Si at substrate temperatures from 25°C to 385°C. Real time spectroscopic ellipsometry (RTSE) was performed to...
In this study, two series of CdTe thin films were prepared by magnetron sputtering and analyzed in-situ using real time spectroscopic ellipsometry (RTSE). One series consists of CdTe thin films deposited at substrate temperatures ranging from 188°C to 304°C at a fixed Ar sputtering pressure of 18 mTorr, and the other consists of films deposited at pressures ranging from 2.5 to 50 mTorr at a fixed...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.