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Real time spectroscopic ellipsometry (RTSE) from the near-infrared to ultraviolet has been applied for analysis of the deposition of polycrystalline thin films that form the basis of two key photovoltaic heterojunction configurations, superstrate SnO2/CdS/CdTe and substrate Mo/Cu(In1−xGax)Se2/CdS. The focus of this work is to develop capabilities for monitoring and controlling the key steps in the...
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