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We demonstrate all-optical pattern recognition using semiconductor optical amplifier logic gates. For the first time, target patterns up to 256 bits long were successfully recognised and located in 42 Gbit/s data.
We demonstrate all-optical pattern recognition using semiconductor optical amplifier logic gates. For the first time, target patterns up to 256 bits long were successfully recognised and located in 42Gbit/s data.
We propose a novel programmable pattern recognition system employing all-optical logic gates and experimentally demonstrate key functions at 42 Gbit/s. Gate count is independent of target length and the temporal position of the target is identified.
The number of incorrect matches of SIFT keypoints will sharply increase when the SIFT-based registration algorithm is adopted for pairs of multi-spectral remote images, owing to the significant difference in the image intensity between multi-spectral images. Scale restriction criteria for keypoint matching are proposed, and experimental results demonstrate that it will greatly improve match performance.
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