The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper describes a fast protection circuit for silicon carbide metal-oxide semiconductor field-effect transistors (SiC MOSFETs) subjected to hard-switching faults (HSFs). In terms of reliability of power converters, the protection of power semiconductors against short-circuit failures is of great concern. The reverse transfer capacitance increases with decreasing drain-source voltage during normal...
This paper describes a high-speed protection circuit for insulated-gate bipolar transistors (IGBTs) subjected to hard-switching faults (HSFs). The reverse transfer capacitance depends on the collector–emitter voltage, and it produces a significant effect on the switching behavior not only under normal conditions but also under HSF conditions. A gate charge characteristic under HSF conditions differs...
This paper describes a high-speed protection circuit for IGBTs subjected to hard-switching faults (HSF). The reverse transfer capacitance depends on a collector-emitter voltage and it produces a significant effect on a switching behavior not only under normal conditions but also under HSF conditions. A gate charge characteristic under HSF conditions differs from that under normal turn-on conditions...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.