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The system-level ESD noises induced by a secondary discharge at voltage suppressor devices in a mobile product are measured and analyzed. Two kinds of voltage suppressor devices, voltage clamping-type and snapback-type devices, are characterized using TLP measurements. The voltage waveforms at the voltage suppressor devices and the power-ground decoupling capacitors are measured and analyzed according...
Accurate measurements of electromagnetic fields are essential to analyze the radiated noise due to unwanted electrostatic discharge (ESD) events at electronic devices. Usually, to know the radiated noise by ESD events, the voltages induced at field probes are measured, and the fields are obtained from the voltage by de-convolving the probe factor. In this paper, the two probe-factor deconvolution...
As the high performance very-large-scale integration (VLSI) systems operate with high speed and low voltage, the system-level electrostatic discharge (ESD) event is becoming one of the important noise sources causing logic errors and system malfunctions such as system reboot or fault. To understand the ESD noise phenomena and improve the system-level ESD noise immunity for devices, the accurate ESD...
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