Search results for: A. Jain
2016 IEEE International Electron Devices Meeting (IEDM) > 5.4.1 - 5.4.4
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 236 - 243
Thin Solid Films > 1995 > 259 > 2 > 167-173
2016 IEEE International Electron Devices Meeting (IEDM) > 5.4.1 - 5.4.4
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 236 - 243
Thin Solid Films > 1995 > 259 > 2 > 167-173