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We use thin film nanocrystalline (NC) iron pyrite as an interface layer at the back contact of CdS/CdTe solar cells. In both spattered and CSS deposited CdTe devices, improvements in Voc and FF were obtained after the inclusion of the NC FeS2 layer. Repeated tests show that Voc increases by >30 mV and FF increases by ∼3.5% for a standard CdTe device having efficiency of ∼13%. The devices tested...
Electron beam induced current (EBIC) is a powerful technique which measures the charge collection efficiency of electron-hole pairs generated by an electron beam. EBIC offers sub-micron spatial resolution and is naturally suited to study polycrystalline materials. Ideally, an EBIC measurement reflects the spatially resolved quantum efficiency of the solar cell. However, critical analysis of low energy...
We have studied the effect of substrate temperature in molybdenum (Mo) back contact deposition on its structural evolution, optical properties, and most importantly, the over-deposited CuIn1−xGaxSe2 solar cell performance. A series of Mo thin films was DC sputtered onto thermally oxidized Si at substrate temperatures from 25°C to 385°C. Real time spectroscopic ellipsometry (RTSE) was performed to...
Mapping spectroscopic ellipsometry (M-SE) has been applied for optimization of polycrystalline CdS/CdTe solar cell fabrication on transparent conducting oxide (TCO) coated glass superstrates. During fabrication of these solar cells, the structure undergoes key processing steps after the sputter-deposition of the CdS/CdTe. These steps include CdCl2 treatment of the CdTe layer and subsequent deposition...
Wide band-gap, p-type doped, hydrogenated amorphous silicon-carbon alloy (a-Si1−xCx:H:B) layers deposited by plasma enhanced chemical vapor deposition (PECVD) under conditions that yield efficient hydrogenated amorphous silicon (a-Si:H) p-i-n solar cells have been applied as back contacts to sputter-deposited CdTe superstrate solar cells. We report a maximum observed Voc of 0.78 V and a best initial...
Real time spectroscopic ellipsometry (RT-SE) in the near-infrared to ultraviolet range, as well as pre-deposition and post-deposition mid-infrared spectroscopic ellipsometry (IR-SE) have been applied as probes of the formation of optical interfaces in sputter-deposited CdS/CdTe solar cell structures. Both optical probes are configured for reflection from the film side of the solar cell structure....
Through-the-glass spectroscopic ellipsometry (SE) has been applied in mapping analyses of 60 cm × 120 cm panels consisting of soda-lime glass coated with a four-layer transparent conducting oxide (TCO) stack and a two-layer CdS/CdTe photovoltaic (PV) heterojunction. Both off-line and on-line measurement configurations have been evaluated, using a rotating compensator for modulation of the incident...
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