The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We report the results of displacement damage testing using 1 MeV equivalent neutron irradiation of a range of Intersil power management and analog parts, including an operational amplifier, voltage reference, linear voltage regulators, comparator, power MOSFET driver, pulse width modulators, analog switches and processor supervisory circuit.
We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL75052SEH low dropout regulator (LDO) together with a discussion of electrical specifications and fabrication process.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.