The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper analyzes the power-cycling capability of insulated-gate bipolar transistor (IGBT) modules in a conventional matrix converter used as a motor drive. The analysis is made under various conditions for this topology, including low-speed-operation capability, high-speed thermal- and power-cycling capabilities, etc. It was found that the power-cycling mean time to failure of IGBT in a matrix...
This paper analyzes the power cycling capability of semiconductor under various conditions for adjustable speed drive (ASD). An analysis is made that calculates the mean time to failure (MTTF) of the semiconductor under various conditions, including low speed operation capability, high speed thermal capability and overload capability. After that, the MTTF estimations of the IGBT under different heatsink...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.