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We performed X‐ray fluorescence holography measurements on an In‐doped Bi2Se3 topological insulator and obtained an in‐plane atomic image in the vicinity of In. We found that atomic images at the positions of the first nearest neighbors (NNs) are very weak whereas those at the positions of the second and the third NNs are relatively strong. On the basis of the fact that In is half of the atomic number...
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