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Light- and elevated temperature-induced degradation (LeTID) in multicrystalline silicon can reduce the efficiency of solar cells significantly. We analyse the influence of the firing temperature profile on the degradation behaviour of neighbouring mc-Si wafers, varying peak temperatures above 800°C (measured) as well as heating and cooling ramps. The degradation intensity is determined by the normalized...
Carrier lifetime measurements via harmonically modulated luminescence have considerably evolved recently, giving rise to numerous relevant advances and applications in materials science. An essential asset of this technique lies in its unified applicability across the photovoltaic processing chain—from ingots to solar cells. This paper shows how present gaps in carrier lifetime metrology are overcome...
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