Search results for: P. Hashemi
2010 International Electron Devices Meeting > 34.5.1 - 34.5.4
IEEE Electron Device Letters > 2010 > 31 > 8 > 782 - 784
2010 International Electron Devices Meeting > 34.5.1 - 34.5.4
IEEE Electron Device Letters > 2010 > 31 > 8 > 782 - 784