Search results for: P. Hashemi
2015 IEEE International Electron Devices Meeting (IEDM) > 8.8.1 - 8.8.4
2010 International Electron Devices Meeting > 34.5.1 - 34.5.4
Thin Solid Films > 2008 > 516 > 10 > 3172-3178
2015 IEEE International Electron Devices Meeting (IEDM) > 8.8.1 - 8.8.4
2010 International Electron Devices Meeting > 34.5.1 - 34.5.4
Thin Solid Films > 2008 > 516 > 10 > 3172-3178