Search results for: Matteo Meneghini
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2199 - 2207