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In this paper, a test chip is introduced to study the susceptibility of low dropout voltage regulator (LDO) by direct RF power injection (DPI) method. The structure and failure mechanism of LDO module is analyzed. Both of hardware and software DPI set-up are given to characterize the test flow. A novel test method of on-chip sensor sampling is described by the functional frame and sampling arithmetic...
This paper deals with the EMC modeling of integrated circuits and the standardized model IEC 62433-2 (Integrated Circuit Emission Model — Conducted Emission [1]). This standardized model has been applied into a basic digital circuit: a ring oscillator. This work presents an alternative approach to model and quantify the Internal Activity of any digital or analog integrated circuit, and its use has...
Due to the increasing usage of integrated circuits (ICs) ensuring the electromagnetic compatibility (EMC) of modern electronic systems becomes more and more a major technical challenge. Especially for the automotive industry the undisturbed operation of electronics systems is of vital importance for the safety and the reliability of motorized vehicles. Moreover with CMOS nanometric technologies, new...
Two new miniature near-field 'cube probe' structures for EMC/EMI measurements are proposed. Their performances are compared to those of the classical H-field loop probe in two orthogonal planes. The single cube probe effectively replaces three conventional orthogonally oriented loops. An array of cube probes is also proposed to form a near-field scan module dedicated to the characterisation of integrated...
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