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Effects of electro-less Ni layer as barrier/seed layers were evaluated for high reliable and low cost Cu TSVs. To electrically characterize the effectiveness of a Ni layer as barrier/seed layers for TSV application, we fabricated the trench MOS capacitor with 5µm dia. and 50µm depth TSV array. Via holes were successfully filled by Cu electro-plating by using Ni seed layer. To characterize the blocking...
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