The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper presents a Time to Digital Converter (TDC)-based low cost and high quality on-chip delay measurement with adjacency testable scan design. Adjacency test is useful for on-chip delay measurement with TDC because it can generate arbitrary 1-bit transition to arbitrary input with smaller number of seed vectors. However the area overhead is high because it requires an extra shift register whose...
We have proposed and designed a current-driven optical gate switch using a Si waveguide and phase-change material. The ON-state loss and the power consumption of the optimized structure are 0.63 dB and 60 mW, respectively.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.