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This paper presents a Time to Digital Converter (TDC)-based low cost and high quality on-chip delay measurement with adjacency testable scan design. Adjacency test is useful for on-chip delay measurement with TDC because it can generate arbitrary 1-bit transition to arbitrary input with smaller number of seed vectors. However the area overhead is high because it requires an extra shift register whose...
This paper presents a fast scan-based on-chip delay measurement with variable clock generator using extra latches and multiple asynchronous transfer scan chains. Usual scan-based on-chip delay measurement requires continuous scan-in operation for assigning the identical test vectors and continuous scan-out operations for transferring the identical test responses, both of which result in long measurement...
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