Search results for: Giacomo Langfelder
Microelectronics Reliability > 2017 > 75 > C > 59-68
Journal of Microelectromechanical Systems > 2015 > 24 > 4 > 822 - 830
IEEE Transactions on Industrial Electronics > 2012 > 59 > 12 > 4938 - 4948
Microelectronics Reliability > 2017 > 75 > C > 59-68
Journal of Microelectromechanical Systems > 2015 > 24 > 4 > 822 - 830
IEEE Transactions on Industrial Electronics > 2012 > 59 > 12 > 4938 - 4948