Search results for: Giacomo Langfelder
Microelectronics Reliability > 2017 > 75 > C > 59-68
Journal of Microelectromechanical Systems > 2015 > 24 > 6 > 1817 - 1826
Microelectronics Reliability > 2017 > 75 > C > 59-68
Journal of Microelectromechanical Systems > 2015 > 24 > 6 > 1817 - 1826