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This paper describes an automated sequential sampling algorithm for EMI near-field scanning of electronic systems which allows to measure both magnitude and phase of the electromagnetic near-fields simultaneously. The main goal of the sequential sampling algorithm is to drastically reduce the total measurement time to obtain a complete model of the electronic system's near-field distribution. Measuring...
Parameterized reduced order models are important for the design and analysis of microwave structures and systems. Quite often, a large set of models (nodes) with respect to a design parameter variation are uniformly chosen in the parameter design space, which are subjected to model order reduction algorithms and interpolated into a multidimensional model. In order to preserve passivity in the parameterization...
In this paper, a recently proposed automatic and sequential sampling and modeling algorithm for near-field scanning of printed circuit boards and/or integrated circuits is further optimized in two ways. The main goal of this optimization is to reduce the total measurement time needed to come to a complete model of the near-field distribution over the full scan area. The first optimization is that...
This paper presents an automated procedure to determine the electric or magnetic near-field profile of electronic systems and devices in a given plane. It combines sequential sampling to determine the optimal coordinates of near-field scan points at arbitrary coordinates in the scanning plane. The effectiveness of the approach is illustrated by applying it to both a simulated and a measured printed...
This paper describes a robust and accurate black-box macromodeling technique, in which the constitutive equations combine both closed-form delay operators and low-order rational coefficients. These models describe efficiently electrically long interconnect links. The algorithm is based on an iterative weighted least-squares process and can be interpreted as a generalization of the well-known Vector...
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