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This work studies the impact of annealing temperatures on PMNT (lead–magnesium niobate–lead titanate, Pb(Mg 0.33 Nb 0.67 ) 0.65 Ti 0.35 O 3 ) thin films grown on a silicon substrate. The electrical properties of the thin films, such as dielectric constant and loss tangent, are shown to depend strongly on the annealing temperature, with the best electrical properties...
This paper reports on the temperature dependence of the electrical properties of high-k lead–magnesium–niobium titanate thin films processed with different compositions (with and without nanoparticles) and with different annealing temperatures (450°C and 750°C). These characterization results support the ongoing investigation of the material's electrical properties which are necessary before the dielectric...
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