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The conventional test-per-scan built-in self-test (BIST) scheme needs a number of shift cycles followed by one capture cycle. Fault effects received by the scan flip-flops are shifted out while shifting in the next test vector, like scan testing. Unlike deterministic testing, it is unnecessary to apply a complete test vector to the scan chains. A new scan-based BIST scheme is proposed by properly...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.