Search results for: Zhiyuan Hu
Microelectronics Reliability > 2016 > 56 > C > 1-9
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1400 - 1406
IEEE Electron Device Letters > 2014 > 35 > 5 > 503 - 505
Microelectronics Reliability > 2016 > 56 > C > 1-9
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1400 - 1406
IEEE Electron Device Letters > 2014 > 35 > 5 > 503 - 505