The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A fully-digital VCO-based ADC featuring a novel beat frequency detection scheme is demonstrated in 65nm LP CMOS. The proposed beat frequency based ADC is unique compared to previous VCO-based ADCs in that it is highly effective in measuring extremely small changes (e.g., 0.01%) in the VCO frequency within a short sampling time (e.g., 100 VCO periods). Direct amplifier-less A-to-D conversion of a 1...
Negative bias temperature instability (NBTI) is one of the most critical device reliability issues in sub-130 nm CMOS processes. In order to better understand the characteristics of this mechanism, accurate and efficient means of measuring its effects must be explored. In this work, we describe an on-chip NBTI degradation sensor using a delay-locked loop (DLL), in which the increase in pMOS threshold...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.