The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
With the waffle layout style, body-injected technique implemented by body current injection on n-channel lateral DMOS (nLDMOS) has been successfully verified in a 0.5-mum 16-V BCD process. The TLP measured results confirmed that the secondary breakdown current (It2) of waffle nLDMOS can be significantly increased by the body current injection with the corresponding trigger circuit design. The latchup...
Electrostatic-discharge robustness of n-channel lateral DMOS (nLDMOS) has been significantly increased in this letter through the waffle-layout style with body-current injection. This body-injected technique on high-voltage nLDMOS has been successfully verified in a 0.5-mum 16-V bipolar CMOS DMOS process without additional process or mask modification. The TLP-measured results confirmed that the secondary...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.