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Soft errors have been a concern in memory reliability for many years. With device feature size decreasing and memories density increasing, a single event upset (SEU) in memory may generate adjacent bit upsets in a word that may cause data errors. To avoid data errors in memories, Error Correction Codes (ECCs) are used. As multiple bits affected become frequent, the Single Error Correction (SEC) codes...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.