Search results for: Yan Han
Microelectronics Reliability > 2016 > 61 > C > 106-110
Solid-State Electronics > 2016 > 116 > C > 80-87
IEEE Electron Device Letters > 2013 > 34 > 9 > 1178 - 1180
IEEE Electron Device Letters > 2012 > 33 > 6 > 893 - 895
IEEE Electron Device Letters > 2012 > 33 > 10 > 1345 - 1347
IEEE Electron Device Letters > 2010 > 31 > 10 > 1089 - 1091
IEEE Electron Device Letters > 2010 > 31 > 8 > 845 - 847
Solid State Electronics > 2009 > 53 > 2 > 195-203
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 361 - 366