The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This research employed TiN as a model system to study the degradation of ceramic films at high temperature under controlled atmosphere. The TiN films were prepared on Cu substrates by a cathodic arc plasma deposition technique. The degradation of TiN films on the Cu substrates at high temperature under controlled atmosphere was investigated using X-ray photoelectron spectroscopy and scanning electron...
X-ray photoelectron spectroscopy (XPS) has been used to investigate the thermal annealing of TiN films in the controlled atmosphere. The films were prepared by a cathodic arc plasma deposition technique on Cu substrates. The flowing gases used in the annealing are air, N2, Ar, and CO2/N2/H2 gas mixtures, which possess extremely different nitrogen and oxygen partial pressures. Annealing the samples...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.