Search results for: J R Ahlbin
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 179 - 186
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 1093 - 1097
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-3 > 1338 - 1346
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3386 - 3391