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The combination of a D-Band phase-locked backward-wave oscillator (BWO) with a spectrum analyzer for measurement of permittivity and low loss-tangent is presented. For measuring low loss tangent material, such as CVD diamond and high purity semi-insulating (HPSI) 4H-SiC , at millimeter wave ranges, it is necessary to precisely measure an increase of a few kHz in a line-width of 200 kHz. We describe...
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