Search results for: Ming-Dou Ker
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 474 - 483
IEEE Electron Device Letters > 2010 > 31 > 2 > 159 - 161
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 5 > 1039 - 1047
IEEE Transactions on Circuits and Systems I: Regular Papers > 2009 > 56 > 5 > 966 - 974
IEEE Electron Device Letters > 2009 > 30 > 4 > 389 - 391
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 549 - 560
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1996 > 4 > 3 > 307 - 321