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In the year 2013, IEEE Test Technology Technical Council (TTTC) took an initiative to establish a forum involving young professionals (both from industry and academia) working in the broad domain of manufacturing test, diagnosis, debug, yield improvement and related areas. We organized panel meetings in conjunction with VLSI Test Symposium (VTS) and International Test Conference (ITC) last year to...
As process technologies continue to shrink and design complexity grows, today's designs present a unique set of test challenges including higher test costs, higher power consumption during test, lower design productivity and new defects at small geometries. The designs are larger and using multiple processor cores in SoCs to enable the next generation of mobile internet devices. Each core contains...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.