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Polycrystalline films of CdTe have been thermally deposited on glass substrates. Using the Van der Pauw technique, the dark resistivities have been measured at different temperatures (298-523 K). The resistivity, ρ, was found to decrease markedly in the range of thickness less than 400 nm and was then subjected to a slight decrease at larger thicknesses. The behaviour was found to fit properly with...
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